Fault Diagnosis for Underdetermined Multistage Assembly Processes Via an Enhanced Bayesian Hierarchical Model
Dewen Yu,Junkang Guo,Qiangqiang Zhao,Dingtang Zhao,Jun Hong
DOI: https://doi.org/10.1016/j.jmsy.2020.12.011
IF: 12.1
2021-01-01
Journal of Manufacturing Systems
Abstract:Previous works have shown that only relying on measurement data is generally insufficient to identify root causes of the dimensional variation for the complex manufacturing system. It is also well known that for underdetermined multistage assembly processes (MAPs), the number of measurements is less than that of process errors so that the traditional methods are not available for the variation source identification. Therefore, there exists a substantial challenge for fault diagnosis of underdetermined MAPs, especially for the case with multiple fault patterns. To tackle this problem, a novel approach that integrates statistical analysis with domain knowledge is proposed in this paper. First, the variation propagation model is employed to reveal the inherent relationship between key control characteristics and key product characteristics, and then the corresponding variance model is constructed to interpret process faults by means of the abnormal variance of process errors. Considering that the probability of less process faults is far higher than that of more process faults in MAPs, the problem of fault diagnosis is further transformed into searching the sparse solution of abnormal variance changes for process faults. Afterwards, based on the non-negative property of the covariance matrix, an enhanced Bayesian hierarchical model is developed to favor sparse estimation of the variance for the underdetermined system in MAPs. Finally, experimental results of both the numeric simulation and practical case study demonstrate the proposed diagnosis methodology can effectively identify the process faults for different patterns with system noise.