Abstract:Laser & Photonics ReviewsVolume 18, Issue 8 2470045 Front CoverFree Access In-Situ Wavefront Correction via Physics-Informed Neural Network (Laser Photonics Rev. 18(8)/2024) Xian Long, Xian LongSearch for more papers by this authorYuan Gao, Yuan GaoSearch for more papers by this authorZheng Yuan, Zheng YuanSearch for more papers by this authorWenxiang Yan, Wenxiang YanSearch for more papers by this authorZhi-Cheng Ren, Zhi-Cheng RenSearch for more papers by this authorXi-Lin Wang, Xi-Lin WangSearch for more papers by this authorJianping Ding, Jianping DingSearch for more papers by this authorHui-Tian Wang, Hui-Tian WangSearch for more papers by this author Xian Long, Xian LongSearch for more papers by this authorYuan Gao, Yuan GaoSearch for more papers by this authorZheng Yuan, Zheng YuanSearch for more papers by this authorWenxiang Yan, Wenxiang YanSearch for more papers by this authorZhi-Cheng Ren, Zhi-Cheng RenSearch for more papers by this authorXi-Lin Wang, Xi-Lin WangSearch for more papers by this authorJianping Ding, Jianping DingSearch for more papers by this authorHui-Tian Wang, Hui-Tian WangSearch for more papers by this author First published: 12 August 2024 https://doi.org/10.1002/lpor.202470045AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat Graphical Abstract In-Situ Wavefront Correction In article number 2300833, Xian Long, Jianping Ding, Hui-Tian Wang, and co-workers propose a novel generic calibration scheme based on Zernike-fitting neural networks and a vortex beam focusing model, which enables in-situ wavefront correction with just a single-shot measurement. The proposed method offers fast calibration, a streamlined optical path, and remarkable versatility, making it highly promising for diverse wavefront engineering applications. Volume18, Issue8August 20242470045 RelatedInformation

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