Ellipsometry study of the dielectric function of Ag 2 Se thin films deposited by electrodeposition

C.A.M. Román-Varela,C.J. Diliegros-Godines,M.E. Calixto,E. López-Cruz
DOI: https://doi.org/10.1016/j.matlet.2024.136338
IF: 3
2024-03-21
Materials Letters
Abstract:Polycrystalline β-Ag 2 Se thin films were obtained by electrodeposition. Crystal structure, morphology, and chemical composition properties of the films were analyzed and discussed. In addition, the complex dielectric function and band gap energy of electrodeposited β-Ag 2 Se thin films were studied by ellipsometry spectroscopy technique. A dispersion model with three Tauc-Lorentz oscillators was used to fit the ellipsometry angles Ψ and Δ, taking into account a multilayered system consisting of Glass/Fluorine-doped Tin Oxide (FTO)/FTO + β-Ag 2 Se/β-Ag 2 Se/roughness. The optical effect contribution of the FTO + β-Ag 2 Se interlayer in the optical model was also observed by optical transmittance. As a result, the experimental band gap of β-Ag 2 Se thin films is 0.24 eV.
materials science, multidisciplinary,physics, applied
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