Degradation State Partition and Compound Fault Diagnosis of Rolling Bearing Based on Personalized Multilabel Learning

Xin Ma,Yu Hu,Menghui Wang,Fengying Li,Youqing Wang
DOI: https://doi.org/10.1109/tim.2021.3091504
IF: 5.6
2021-01-01
IEEE Transactions on Instrumentation and Measurement
Abstract:The prognostic and health management (PHM) of rolling bearings has been a popular research area. Since bearing fault is inevitable during degradation, how to improve the PHM performance based on both degradation states and fault types is still an open problem. In this study, two multilabel learning algorithms are proposed for PHM of rolling bearings, named personalized binary relevance (PBR) and hierarchical multilabel K-nearest neighbor (HML-KNN), respectively. Degradation states and fault types are used as the labels of the bearing data so that each sample has a corresponding label sequence, that is to say, the PHM problem is converted to a multilabel learning problem. Both algorithms have a personalized search process, which can not only help samples build a personalized model to improve classification accuracy but also solve the problem of data imbalance between labels. At the same time, the two algorithms also have their own characteristics and focus on different application situations. The PBR algorithm has faster modeling speed, more flexible use, and replaceable subclassifiers. HML-KNN is a high-order algorithm with global information analysis capabilities through the hierarchical processing of data and the conversion of label information. Both methods have achieved good enough results in the XJTU-SY bearing dataset. In order to illustrate the practicality of the algorithm, the experimental part further increases the difficulty. Using only a single faulty sample as the training set to determine the type of compound fault, the algorithms also show high performance. In the era of industrial big data, the depth of data mining and the design of algorithm models will help us better manage equipment health.
engineering, electrical & electronic,instruments & instrumentation
What problem does this paper attempt to address?