Improved uniformity of atomic-layer-deposited HfO 2 film along the length of glass monocapillary with high length-diameter ratio

Yanli Li,Hongchang Wu,Wensi Lv,Xiangdong Kong,Li Han,He Zhang
DOI: https://doi.org/10.1016/j.optmat.2024.115440
IF: 3.754
2024-05-02
Optical Materials
Abstract:It has been a difficult to deposit a uniform film on the inner surface of monocapillary due to the high length-diameter ratio. Atomic layer deposition (ALD) shows great potential to coat conformal film on complex substrates. However, it is still a challenge to coat uniform film along the length of the capillary for regular deposition parameters. In this work, HfO 2 film was deposited inside monocapillary via ALD. The film uniformity along the monocapillary was investigated by cross-section scanning electron microscope (SEM) images and the bond states of one of the HfO 2 films were studied via X-ray photoelectron spectroscopy (XPS). Using the routine deposition parameters, the gas flowing through the monocapillary is controlled to be small, large and medium qualitatively by covering some of the inlets or outlets, changing the connection between monocapillary and outlets simply. SEM results demonstrate that smooth HfO 2 film with uniform thickness can be acquired on the inner surface of monocapillary with length-diameter ratio 200 (length 10 cm and inner diameter 0.5 mm). XPS results show that Hf hydroxide is generated when the gas flowing through the monocapillary is large.
materials science, multidisciplinary,optics
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