4f‐Less Terahertz Optical Pattern Recognition Enabled by Complex Amplitude Modulating Metasurface Through Laser Direct Writing

Zongyuan Wang,Bin Hu,Jingyu Liu,Guocui Wang,Weiguang Liu,Chenjie Xiong,Jianzhou Huang,Juan Liu,Yan Zhang
DOI: https://doi.org/10.1002/adom.202300575
IF: 9
2023-05-27
Advanced Optical Materials
Abstract:A full‐diffraction‐based 4f‐less optical pattern recognition (OPR) method is proposed using a single complex amplitude modulating metasurface in the THz band, which is valid for systems with large Fresnel numbers. Moreover, a laser‐induced graphene technique is applied for processing the device. A 15 mm × 15 mm metasurface can be fabricated by one‐step laser writing in 34 s. Optical pattern recognition (OPR) has the advantage of single intensity detection ability for low‐cost terahertz (THz) systems of imaging or security checks. However, conventional 4f‐system‐based OPR is limited by the paraxial approximation and bulky device volumes for THz applications. Here, a full‐diffraction‐based 4f‐less OPR method is proposed using a single complex‐amplitude‐modulating metasurface, which is valid for systems with large Fresnel numbers. Moreover, a laser‐induced graphene technique is applied for processing the device. A 15 mm × 15 mm metasurface can be fabricated by one‐step laser writing in 34 s, indicating the potential of the proposed method in developing THz OPR systems with miniaturization, fast fabrication, and low‐cost.
materials science, multidisciplinary,optics
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