Parameter estimation from an Ornstein-Uhlenbeck process with measurement noise

Simon Carter,Lilianne R. Mujica-Parodi,Helmut H. Strey
DOI: https://doi.org/10.1103/physreve.110.044112
IF: 2.707
2024-10-10
Physical Review E
Abstract:We investigate the impact of noise on parameter fitting for an Ornstein-Uhlenbeck process, focusing on the effects of multiplicative and thermal noise on the accuracy of signal separation. To address these issues, we propose algorithms and methods that can effectively distinguish between thermal and... [Phys. Rev. E 110, 044112] Published Wed Oct 09, 2024
physics, fluids & plasmas, mathematical
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