Abstract:Limited data usually cause deep neural networks to hold poor performance after training, and many generative models are proposed to synthesize data to improve the performance of models. However, existing models ignore capturing the small defect details (e.g., features and locations), resulting in that most models cannot augment the Defect Location Sensitive Data (DLS data) in which the ratio of object size to the image size is small (e.g., 20%) and the locations of the defects are only on the object. In this paper, we propose a new augmentation model, named Defect Location Sensitive data augmentation GAN (DLS-GAN), to address DLS data augmentation problem. First, we modify the vanilla generator with two Encoder-Decoder models, and view the limited masked-images masked by labeling the defect-free pixels while remaining the defect pixels in defect images and many defect-free images as the input of the two models. The extracted feature map from the first Encoder-Decoder model provides the defect features and location information; the second one extracts the features of defect-free images, and integrates the two different features with a designed Defect Feature Transfer Module to synthesize images with desired defects. Second, we employ two discriminators to estimate the scores of both distribution matching degree and defect similarity between real data and generated ones. With the two modifications, we design a new loss function, and then prove that it makes our model get converged. Last, we conduct extensive experiments to demonstrate the significant performance improvement and generalizability of DLS-GAN on different types of DLS datasets. The experimental results show that our DLS-GAN outperforms the SOTA generative models in terms of synthesizing high quality images with desired defects. Note to Practitioners—Automated defect image detectors play an important role in the field of automated manufacturing. Training a detector with superior detection performance usually requires a large number of samples. However, it is difficult to collect many defect samples in practice. Although existing generative methods can synthesize realistic-like images, they cannot generate the Defect Location Sensitive Data (DLS Data) which refer to the samples that the defects appear at the specific locations in product objects, resulting in the synthesized images invalid. This paper proposes a new defect image generation model called DLS-GAN to address this problem, and validates its performance in different real-world industrial datasets ranging from DLS Data to Non-DLS Data. Such generated images can be adopted as useful resources for improving the detection performance of automated detector.

Aircraft Skin Defect Detection Based on Fourier GAN for Data Augmentation

Dual-Path GAN: A Method for Enhancing Small-scale Defect Detection on Metal Images

Surface Defect Detection of Mobile Phone Screen Based on Generative Adversarial Networks

Detection algorithm of aircraft skin defects based on improved YOLOv8n

FC-YOLO: An aircraft skin defect detection algorithm based on multi-scale collaborative feature fusion

Prior-guided GAN-based Interactive Airplane Engine Damage Image Augmentation Method

DG-GAN: A High Quality Defect Image Generation Method for Defect Detection

Sketch-guided spatial adaptive normalization and high-level feature constraints based GAN image synthesis for steel strip defect detection data augmentation

Mask2Defect: A Prior Knowledge Based Data Augmentation Method for Metal Surface Defect Inspection

DLS-GAN: Generative Adversarial Nets for Defect Location Sensitive Data Augmentation

Particleboard Surface Defect Inspection Based on Data Augmentation and Attention Mechanisms

A Deep-Learning-Based Approach for Aircraft Engine Defect Detection

Defect-GAN: High-Fidelity Defect Synthesis for Automated Defect Inspection

Defect Detection of MEMS Based on Data Augmentation, WGAN-DIV-DC, and a YOLOv5 Model

Utilizing Generative Adversarial Networks for Image Data Augmentation and Classification of Semiconductor Wafer Dicing Induced Defects

A novel MAS-GAN-based data synthesis method for object surface defect detection

ACGAN: adaptive conditional generative adversarial network architecture predicting skin lesion using collaboration of transfer learning models

Rail surface defect data enhancement method based on improved ACGAN

A Novel Adversarial Deep Learning Method for Substation Defect Image Generation

DCGAN-Based Image Data Augmentation in Rawhide Stick Products' Defect Detection

Data Augmentation for Skin Lesion using Self-Attention based Progressive Generative Adversarial Network