Multipactor Analysis of Dielectric-Loaded Parallel Plates with Local-Regional Increment of Secondary Emission Yield

Shu Lin,Huan Zhong,Lin Huang,Yongdong Li,Patrick Y. Wong,Peng Zhang
DOI: https://doi.org/10.1109/ivecivesc60838.2024.10694823
2024-01-01
Abstract:Multipactor effect is an undesired avalanche-like breakdown in powerful microwave devices, where the presence of dielectric material inevitably forms charge accumulation and accordingly leads to complicated dynamic evolution. Meanwhile, local-regional increment of secondary emission yield (SEY) is probably exacerbated by unexpected surface contamination or different surface roughness, especially for dielectric layers that are hard to polish at fabrication. In this research, the multipactor formation process in dielectric-loaded parallel plates with spatial SEY discrepancy on dielectric surface is investigated with 3D EM-PIC simulation. As revealed in the results, opposite charge polarity eventually forms in the high-SEY region on the dielectric surface, which fully dominates multipactor dynamic evolution as the region size increases.
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