Industrial Process Fault Diagnosis Based on Contrastive Clustering-Assisted Discriminative Feature Learning

Sheng Wang,Yinghua Han,Qiang Zhao,Jinkuan Wang
DOI: https://doi.org/10.23919/ccc63176.2024.10662264
2024-01-01
Abstract:In the realm of industrial process automation, the escalating complexity of systems and the surge of data from developments like the Industrial Internet of Things (IIoT) have underscored the urgent need for efficient and precise data-driven fault diagnosis. Traditional methods, despite advancements through deep learning, often struggle to differentiate between various fault categories. This issue is exacerbated in industrial contexts where acquiring and labeling fault data is a resource-intensive task. In response, our innovative approach presents an self-supervised framework, namely contrastive clustering-assisted discriminative feature learning (CCDFL), that ingeniously combines a temporal gate encoder (TGE) for efficient time-series data processing and feature extraction, with a contrastive clustering-assisted discriminator (CCD) leveraging contrastive learning for improved feature discrimination. This synergistic fusion is crucial for accurately identifying and classifying different fault types, marking a significant advancement in intelligent manufacturing and fault diagnosis. It is particularly adept at handling diverse and unforeseen faults, offering practical solutions in complex scenarios. The effectiveness of this method is further substantiated in the experimental section of our study.
What problem does this paper attempt to address?