Abnormal Pattern Recognition for Online Inspection in Manufacturing Process Based on Multi-Scale Time Series Classification

Xiangyu Bao,Yu Zheng,Liang Chen,Dianliang Wu,Xiaobo Chen,Ying Liu
DOI: https://doi.org/10.1016/j.jmsy.2024.08.005
IF: 12.1
2024-01-01
Journal of Manufacturing Systems
Abstract:The collection of large volumes of temporal data during the production process is streamlined in a cyber manufacturing environment. The ineluctable abnormal patterns in these time series often serve as indicators of potential manufacturing faults. Consequently, the presence of effective analytical methods becomes essential for monitoring and recognizing these abnormal manufacturing patterns. However, the extensive process data may contain various minor abnormal patterns, typically reflecting changes in production status influenced by multiple anomalous causes. This study introduces an approach for recognizing abnormal manufacturing patterns through multi-scale time series classification (TSC). Long-term process signals undergo slicing using dynamically sized observation windows and subsequent classification at multiple scales employing our proposed TSC model, the distance mode profile-multi-branch dilated convolution network (DMP-MDNet). DMP-MDNet comprises two key modules aimed at bypassing complicated feature engineering and enhancing generalization capability. The first module, DMP, uses similarity measurement to encode scale- and magnitude-invariant temporal properties. Subsequently, the MDNet, equipped with multi-receptive field sizes, effectively leverages multi-granularity data for accurate classification. The effectiveness of our method is demonstrated through the analysis of a real-world body-in-white production dataset and various widely used public TSC datasets, showing promising applicability in actual manufacturing processes.
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