Abstract:The capability of machine learning methods for identifying and separating artifacts that appear in a typical X‐ray diffraction image is demonstrated.In situ synchrotron high‐energy X‐ray powder diffraction (XRD) is highly utilized by researchers to analyze the crystallographic structures of materials in functional devices (e.g. battery materials) or in complex sample environments (e.g. diamond anvil cells or syntheses reactors). An atomic structure of a material can be identified by its diffraction pattern along with a detailed analysis of the Rietveld refinement which yields rich information on the structure and the material, such as crystallite size, microstrain and defects. For in situ experiments, a series of XRD images is usually collected on the same sample under different conditions (e.g. adiabatic conditions) yielding different states of matter, or is simply collected continuously as a function of time to track the change of a sample during a chemical or physical process. In situ experiments are usually performed with area detectors and collect images composed of diffraction patterns. For an ideal powder, the diffraction pattern should be a series of concentric Debye–Scherrer rings with evenly distributed intensities in each ring. For a realistic sample, one may observe different characteristics other than the typical ring pattern, such as textures or preferred orientations and single‐crystal diffraction spots. Textures or preferred orientations usually have several parts of a ring that are more intense than the rest, whereas single‐crystal diffraction spots are localized intense spots owing to diffraction of large crystals, typically >10 μm. In this work, an investigation of machine learning methods is presented for fast and reliable identification and separation of the single‐crystal diffraction spots in XRD images. The exclusion of artifacts during an XRD image integration process allows a precise analysis of the powder diffraction rings of interest. When it is trained with small subsets of highly diverse datasets, the gradient boosting method can consistently produce high‐accuracy results. The method dramatically decreases the amount of time spent identifying and separating single‐crystal diffraction spots in comparison with the conventional method.

A neural network reconstruction approach for obtaining parallax-free X-ray powder diffraction computed tomography data from large samples

A neural network reconstruction approach for obtaining parallax-free X-ray powder diffraction computed tomography data from large samples

Neural networks for rapid phase quantification of cultural heritage X‐ray powder diffraction data

A Self-Supervised Approach to Reconstruction in Sparse X-Ray Computed Tomography

Accelerating Materials Discovery: Automated Identification of Prospects from X‐Ray Diffraction Data in Fast Screening Experiments

AI-enabled high-resolution scanning coherent diffraction imaging

Parallax in angular sensitive powder diffraction tomography

Towards end-to-end structure determination from x-ray diffraction data using deep learning

Texture tomography with high angular resolution utilizing sparsity

Artifact Identification in X-ray Diffraction Data using Machine Learning Methods

Reconstruction of nanoscale particles from single-shot wide-angle FEL diffractions patterns with physics-informed neural networks

AI-enhanced X-ray diffraction analysis: towards real-time mineral phase identification and quantification

Advantage of Machine Learning over Maximum Likelihood in Limited-Angle Low-Photon X-Ray Tomography

Enhancing deep-learning training for phase identification in powder X-ray diffractograms

Artifact identification in X‐ray diffraction data using machine learning methods

Autonomous Electron Tomography Reconstruction with Machine Learning

Autonomous Polycrystalline Material Decomposition for Hyperspectral Neutron Tomography

Neural rendering enables dynamic tomography

Physics-informed neural networks for diffraction tomography

Phase quantification using deep neural network processing of XRD patterns

Deep Learning of Structural Morphology Imaged by Scanning X-ray Diffraction Microscopy