Multi-layer Internal Short-Circuit Mechanism and Thermal Runaway Risk Assessment of Lithium-Ion Batteries Using Nail Penetration Simulation

Yimao Ren,Huirou Zhang,Lei Wei,Xuning Feng,Weixiong Wu
DOI: https://doi.org/10.1016/j.est.2024.112824
IF: 9.4
2024-01-01
Journal of Energy Storage
Abstract:Internal short-circuit (ISC) is a common link in the chain of thermal runaway inducement of Lithium-ion batteries (LIBs), and its mechanism is not fully understood. Employing nail penetration simulation provides a valuable approach for evaluating the thermal runaway risk in LIBs. In this work, a multi-layer electrical-thermal coupled model comprising five unit cells was constructed to reveal the multi-layer ISC mechanism during the layer-bylayer ISC process. The relationship between penetration depth and various parameters including voltage, Li + diffusion behavior, current density distribution, and temperature evolution during ISC is discussed. The results indicate that the voltage exhibits a stair-step decrease with an increase in penetration unit cells, notably showing a significant drop of 1.53 V in the first unit. Additionally, the rupture of the separator triggers the formation of a high-temperature hotspot at the current collector of this unit cell, leading to a temperature peak. To further assess the LIBs risk of ISC scenario, this model is applied to different initial states of charge (SOC), nail radius and nail puncture speed. It shows that with increasing SOC, nail radius and decreasing speed, the maximum temperature exhibits a more pronounced increase. Specifically, with SOC = 90 %, the maximum voltage drop can reach 1.9 V, and the temperature can rise 800 degrees C. This research provides a way for constructing a dynamic ISC model applicable to different types of nail penetration conditions, and highlight the importance of model simulation in LIBs safety issues.
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