Abstract:Nanoscale processor designs pose new challenges not encountered in the world of conventional CMOS designs and manufacturing. Nanoscale devices based on crossed semiconductor nanowires (NWs) have promising characteristics in addition to providing great density advantage over conventional CMOS devices. This density advantage could, however, be easily lost when assembled into nanoscale systems and especially after techniques dealing with high defect rates and manufacturing related layout/doping constraints are incorporated. Most conventional defect/fault-tolerance techniques are not suitable in nanoscale designs because they are designed for very small defect rates and assume arbitrary layouts for required circuits. Reconfigurable approaches face fundamental challenges including a complex interface. between the micro and nano components required for programming. In this paper, we present our work on adding fault-tolerance to all components of a processor implemented on a 2-D semiconductor NW fabric called nanoscale application specific integrated circuits (NASICs). We combine and explore structural redundancy, built-in nanoscale error correcting circuitry, and system-level redundancy techniques and adapt the techniques to the NASIC fabric. Faulty signals caused by defects and other error sources are masked on-the-fly at various levels of granularity. Faults can be masked at up to 15% rates, while maintaining a 7 x density advantage compared to an equivalent CMOS processor at projected 18-mn technology. Detailed analysis of yield, density, and area tradeoffs is provided for different error sources and fault distributions.

RETRACTED: Redundancy-modified NAND Multiplexing for Nanocomputers

Research on Fault-tolerant Techniques Based on Interwoven Redundancy for Nanoscale Circuits

Asymmetric Redundancy: An Enhanced Redundancy Strategy for MLC NAND Flash Memory Storage Systems

Combining Circuit Level and System Level Techniques for Defect-Tolerant Nanoscale Architectures

The Research of FPGA Reliability Based on Redundancy Methods

A Dual-Rail Compact Defect-Tolerant Multiplexer

Defect Tolerance for CNFET-based SRAMs

A CONCURRENT ERROR DETECTION AND CORRECTION BASED FAULT-TOLERANT XOR-XNOR CIRCUIT FOR HIGHLY RELIABLE APPLICATIONS

Design of Nano-Scale Noise Tolerant CMOS Logic Circuits Based on Probabilistic Markov Random Field Approach

Redundant Logic Insertion and Fault Tolerance Improvement in Combinational Circuits

A Non-Redundant Latch with Key-Node-Upset Obstacle of Beneficial Efficiency for Harsh Environments Applications

Fault-Tolerant Nanoscale Processors on Semiconductor Nanowire Grids.

A Dual Process Redundancy Approach to Transient Fault Tolerance for Ccnuma Architecture

A Robust Hardened Latch Featuring Tolerance to Double-Node-Upset in 28nm CMOS for Spaceborne Application.

A Concurrent Error Detection Based Fault Tolerant 32 Nm Xor-Xnor Circuit Implementation

Implicit Programming: A Fast Programming Strategy for Nand Flash Memory Storage Systems Adopting Redundancy Methods.

A Fault-Tolerant Single-Chip Multiprocessor

Key techniques for fault-tolerant real-time embedded system

A fault-tolerant program memory unit for on-board computer

Improving Network Processing Dependability with Heterogeneous Reliability Cores

Triple Modular Redundancy with Shifted Operands