ACAT-transformer: Adaptive Classifier with Attention-Wise Transformation for Few-Sample Surface Defect Recognition

Zhaofu Li,Liang Gao,Xinyu Li,Yiping Gao
DOI: https://doi.org/10.1016/j.aei.2024.102527
IF: 8.8
2024-01-01
Advanced Engineering Informatics
Abstract:Deep learning-based methods demonstrate acceptable performance on few-sample surface defect recognition, which is a pivotal instrument for quality control in intelligent manufacturing systems. However, deep learning models often experience overfitting to the limited training data and struggle with generalizing to unseen test data due to the discrepancy between the feature distributions. Moreover, the high intra-class variation of defect samples makes it challenging to extract discriminative features. To address the issue of few-sample defect recognition, this paper proposes an Adaptive Classifier with Attention-wise Transformation (ACAT). Firstly, a novel Adaptive Attention Transformation is proposed to integrate into the transformer encoder module for augmenting features which improve the generalization ability. Secondly, a novel Adaptive Classifier is proposed to reduce intra-class variation for obtaining discriminative features. The effectiveness of the proposed ACAT method in addressing the challenge of recognizing defects with few-sample is demonstrated through experimentation on publicly defect datasets X-SDD and GC10, as well as real-world engineering datasets containing printed circuit board (PCB) defects obtained from operational manufacturing facilities. The proposed ACAT method enhances accuracies of 2.82%, 6.15%, and 9.89% contrasted with the most successful method on the X-SDD, GC10, and PCB datasets, respectively, using only five samples per class for training.
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