Abstract:Due to the complexity and dynamics of the semiconductor manufacturing processes, wafer bin maps (WBM) present various defect patterns caused by various process faults. The defect type detection on wafer maps provides information about the process and equipment in which the defect occurred. Recently, automatic inspection has played a vital role in meeting the high-throughput demand, especially with deep convolutional neural networks (DCNN) which shows promising efficiency. At the same time, the need for a large amount of labeled and balanced datasets limits the performance of such approaches. In addition, complex DCNN in recognition tasks can provide redundant features that cause overfitting and reduce interpretability. In this paper, a new hybrid deep model for wafer map fault detection to get over these challenges is proposed. Firstly, a new convolutional autoencoder (CAE) is employed as a synthetization model to fix the high imbalance problem of the dataset. Secondly, for efficient dimensionality reduction, an embedding procedure is applied to the synthesized maps to get sparse encoded wafer maps by reinforcing a sparsity regularization in an encoder-decoder network to form a sparsity-boosted autoencoder (SBAE). The sparse embedding of wafer maps guarantees more discriminative features with 50% reduction in spatial size compared to the original wafer maps. Then, the 2D encoded sparse maps are converted to 1D sinograms to be fed later into another aggressive feature reduction stage using a new modified red deer algorithm with a new tinkering strategy. The resultant feature pool is reduced to ~ 25 1D feature bases, i.e., ~ 1.5% of the initial size of the 2D wafer maps. Finally, for the prediction stage, a simple 1DCNN model is introduced. The proposed inspection model is tested via different experiments on real-world wafer map dataset (WM-811K). Compared to state-of-the-art techniques, the proposed model outperforms their performance even with small-sized 1D feature pool. The average testing accuracy are 98.77% and 98.8% for 9 and 8 types of faults, respectively.

CowSSL: contrastive open-world semi-supervised learning for wafer bin map

Contrastive deep clustering for detecting new defect patterns in wafer bin maps

Learning What and Where to Learn: A New Perspective on Self-supervised Learning

Utilizing the Mean Teacher with Supcontrast Loss for Wafer Pattern Recognition

A self-supervised learning framework based on masked autoencoder for complex wafer bin map classification

OpenCon: Open-world Contrastive Learning

A Novel Contrastive Self-Supervised Learning Framework for Solving Data Imbalance in Solder Joint Defect Detection

Sparse deep encoded features with enhanced sinogramic red deer optimization for fault inspection in wafer maps

Wafer Map Defect Patterns Semi-Supervised Classification Using Latent Vector Representation

Class-Aware Contrastive Semi-Supervised Learning

Looking Beyond Single Images for Weakly Supervised Semantic Segmentation Learning.

Deep Convolutional Generative Adversarial Networks-Based Data Augmentation Method for Classifying Class-Imbalanced Defect Patterns in Wafer Bin Map

AI classification of wafer map defect patterns by using dual-channel convolutional neural network

Deep Open-Set Recognition for Silicon Wafer Production Monitoring

Semi-Supervised Learning via Weight-aware Distillation under Class Distribution Mismatch

Wafer Bin Map Recognition with Autoencoder-based Data Augmentation in Semiconductor Assembly Process

A Deep Convolutional Neural Network for Wafer Defect Identification on an Imbalanced Dataset in Semiconductor Manufacturing Processes

Wafer Map Defect Classification Using Autoencoder-Based Data Augmentation and Convolutional Neural Network

Auto-Labeling for Pattern Recognition of Wafer Defect Maps in Semiconductor Manufacturing

Few-Shot Classification of Wafer Bin Maps Using Transfer Learning and Ensemble Learning

OCI-SSL: Open Class-Imbalanced Semi-Supervised Learning with Contrastive Learning