Abstract:In this paper, a calibration method applied to Successive Approximation Register (SAR) Analog-to-Digital Converter (ADC) is designed, especially applied to the capacitive array in resistive–capacitive combined SAR ADC. Conventionally, auxiliary Digital-to-Analog Converter (DAC) foreground calibration, dynamic element matching (DEM) or digital background calibration are widely used to enhance linearity of data converters. This paper proposes an off-line capacitor selection calibration method that uses an optimal sequence of unity elements for an overall improvement of Signal to Noise and Distortion Ratio (SNDR), Spurious-Free Dynamic Range (SFDR), differential nonlinearity (DNL) and integral nonlinearity (INL). It is worth mentioning that the capacitor mismatch only needs to be calibrated after power on, this kind of foreground calibration will not increase the power consumption of ADC during the normal operation, while the background calibration will consume power consumption all the time. It is important that the calibration proposed is highly relied on a high resolution comparator. This paper provides a high resolution comparator design, the resolution of the comparator reaches 8.35 μV, which already satisfies the demand of a 18-bit differential SAR ADC. During the process of calibration, all capacitors are divided into unit capacitors, and then the capacitors are sorted, reorganized to form each bit. The calibration method is verified by simulating a 18-bit SAR ADC with 500 Monte-Carlo runs, the simulation results show that the average value of SFDR is enhanced by about 36 dB and the average value of SNDR is enhanced by about 27 dB. Therefore, the proposed method is simple and significantly improves the static and dynamic performance of the ADC without obvious additional hardware, and greatly saves area and power consumption. Finally, it is worth mentioning that in high-precision SAR ADCs design, especially above 16 bits, comparator noise and the voltage coefficient of capacitors are the main factors limiting ADC performance, which are not considered in this work.

An 18-Bit SAR ADC with Mixed DAC and Capacitive Recombination Calibration

A 16-Bit 2.5-Ms/s SAR ADC with On-Chip Foreground Calibration

A 15-Bit, 5 MSPS SAR ADC with On-Chip Digital Calibration

An 18-Bit 2MSPS SAR ADC with Double Passive Noise-Shaping Calibration

Design of an 8-Channel 12bits 1MSPS SAR ADC

A 14-Bit 500-Ms/s Pipelined-SAR ADC in 28-Nm CMOS with Foreground and Background Calibration

A 12-Bit, 100 MS/s SAR ADC Based on a Bridge Capacitor Array with Redundancy and Non-Linearity Calibration in 28 Nm CMOS

A Single-Ended 10-Bit 200 Ks/s 607 Μw SAR ADC with an Auto-Zeroing Offset Cancellation Technique

A novel capacitor recombination calibration method applied to 18-bit SAR ADC

A 10-Bit 200-Ks/s 1.76-$\Mu$ W SAR ADC with Hybrid CAP-MOS DAC for Energy-Limited Applications

A 12-Bit 50ms/s SAR ADC with Non-binary Split Capacitive DAC in 40nm CMOS

A 7-bit 900-MS/s 2-Then-3-bit/cycle SAR ADC With Background Offset Calibration

A 16-Bit 300-Ks/s Foreground Calibration SAR ADC with Single-Ended/differential Configurable Input Modes

A Sar-Adc Using Unit Bridge Capacitor and with Calibration for the Front-End Electronics of Pet Imaging

A 16bit 1ms/s High-Bit Sampling SAR ADC with Improved Binary-Weighted Capacitive Array

Optimized Split Capacitive Array in 16-Bit SAR ADC with Redundancy.

Design of a 12-Bit SAR ADC with Calibration Technology

A 0.6-V 10-Bit 200-Ks/s SAR ADC with Higher Side-Reset-and-Set Switching Scheme and Hybrid CAP-MOS DAC

An 11b 80ms/s SAR ADC with Speed-Enhanced SAR Logic and High-Linearity CDAC

A 4-Mw8-b 600-Ms/s 2-B-per-cycle SAR ADC with a Capacitive DAC

A 13-Bit 180-Ms/s SAR ADC with Efficient Capacitor-Mismatch Estimation and Dither Enhancement