Noise Effects on Label-Free Nanoparticles Classification Using Light Scattering Imaging and Deep-Learning Algorithm

Nebras Ahmed Mohamed,Faihaa Mohammed Eltigani,Xuantao Su
DOI: https://doi.org/10.1117/12.2685880
2023-01-01
Abstract:Light scattering techniques provide a broad range of label-free measurements on the submicron and nanoscale levels. Various noises influence nanoparticle light scattering images, affecting image information. This work investigates the noise effect on light scattering imaging-based classification of label-free nanoparticles. Here, we developed a deep learning model based on AlexNet to study the effect of noise on light scattering images for nanoparticle classification. A fiber-based light scattering imaging system is used to detect nanoparticles of 120 nm, 65 nm, and 41 nm in diameter. Three noise models of blurring, Gaussian, and speckle noise are modeled to mimic the light scattering noise. The trained model is tested separately using the original and artificial noisy images to estimate the effect of the noise on the classification performance. The results show that deep learning can distinguish between nanoparticle images of various sizes with an accuracy of 91.5 %, while the three types of noise affect the classification performance. The speckle noise shows the highest effect, with an accuracy drop of around 10%, followed by the Gaussian noise and blurring. With the increased demand for label-free nanoparticle imaging, it is interesting to determine the noise model and preprocessing steps for optimized classification.
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