A Zircon LA-ICPMS Reverse Depth Profiling Analysis Method and Its Geological Application

Yao Lu,Liang-Liang Zhang,Li Liu,Di-Cheng Zhu,Jin-Cheng Xie,Qing Wang
DOI: https://doi.org/10.1039/d3ja00309d
2024-01-01
Journal of Analytical Atomic Spectrometry
Abstract:A new LA-ICPMS analysis method for zircon U–Pb age and trace element composition and its geological application.
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