Predictions for Partial-Dislocation-mediated Processes in Nanocrystalline Ni by Generalized Planar Fault Energy Curves: an Experimental Evaluation

Xiaolei Wu,Yuntian Zhu,E. Ma
DOI: https://doi.org/10.1063/1.2186968
IF: 4
2006-01-01
Applied Physics Letters
Abstract:Generalized planar fault energy (GPFE) curves have been used to predict partial-dislocation-mediated processes in nanocrystalline materials, but their validity has not been evaluated experimentally. We report experimental observations of a large quantity of both stacking faults and twins in nc Ni deformed at relatively low stresses in a tensile test. The experimental findings indicate that the GPFE curves can reasonably explain the formation of stacking faults, but they alone were not able to adequately predict the propensity of deformation twinning.
What problem does this paper attempt to address?