Dropout in Testing Phase Makes Adversarial Samples Generation Difficult

Yuan Wang,Zhiming Wang,Xu-Cheng Yin,Chao Zhu
DOI: https://doi.org/10.18178/wcse.2019.06.017
2019-01-01
Abstract:Deep neural network (DNN) brings the rapid development of pattern recognition algorithm.However, experiments show the vulnerability of deep neural network.This paper studied the problem of generating adversarial samples when we adopt dropout in testing phase.Based on MNIST database, we test four adversarial generation algorithms, two types of adversarial samples, and dropout in different layers of DNN.Several conclusions are obtained: (1) Dropout in testing phase makes DNN more robust with tiny performance loss.(2) Dropout in fully connected layer is the most efficient manner to improve the robustness of DNN.(3) Dropout has different impact on different adversarial samples generation algorithms.
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