Improving Software Defect Prediction by Combining the Information of Class and Package

Xin Peng
2012-01-01
Abstract:In defect prediction models built on software product metrics,metrics are usually collected from two levels: class/file and package/component. It is shown to all that at package-level better recall and precision can be achieved while at class-level the prediction is more efficient. This paper tries to combine the metrics and prediction results of the class-level and package-level. By adding the information of package-level prediction to the class-level,the problem domain,which may determine the defects,is taken into account. To evaluate the effectiveness of the pro-posed method,the paper carries an experiment study on Eclipse3.0 open source code,and compares it with the class-level result. The results show that the new method can improve the recall from 5% to 8%,and when half of the defects are checked,3.6% to 9.84% less lines of codes can be read.
What problem does this paper attempt to address?