Stressing Organic Light-Emitting Diode under Constant-Brightness Driving Mode

Jianbin Wang,Zhanhao Hu,Zhou Zhong,Lei Wang,Jianhua Zou,Yueju Su,Deyun Gao,Huaili Zheng,Jian Wang,Junbiao Peng,Yong Cao

DOI: https://doi.org/10.1016/j.orgel.2015.03.025

IF: 3.868

2015-01-01

Organic Electronics

Abstract:The degradation of the organic light-emitting diodes (OLEDs) was studied under the constant-brightness driving mode. The time-dependent current exhibits a long period of linear increase followed by an exponential increase before the eventually catastrophic failure featured by a vertical increase. A new lifetime Tth is defined as the time for the device to reach the end of the linear increase stage. Similar to the well-known relation between the lifetime and the brightness in the constant-current driving mode, the lifetime and the brightness in the constant-brightness driving mode also fit the formula Ln × Tth = Const., where L is the brightness and n is the acceleration exponent. By examining the current density–voltage–luminance characteristics and the photoluminescence intensity of the devices before and after the stress, it is found that both the reduction of the charge injection efficiency, and the loss of the emissive centers, contribute to the OLEDs’ degradation. The extra power supplied to the device to keep the brightness constant, raises the junction temperature, and eventually leads to the catastrophic failure of the devices.