Gap State-Modulated Van Der Waals Short-Term Memory with Broad Band Negative Photoconductance

Boyu Xu,Dan Guo,Weikang Dong,Huiying Gao,Peng Zhu,Zhiwei Wang,Kenji Watanabe,Takashi Taniguchi,Zhaochu Luo,Fawei Zheng,Shoujun Zheng,Jiadong Zhou
DOI: https://doi.org/10.1002/smll.202309626
IF: 13.3
2024-01-01
Small
Abstract:Floating gate memory (FGM), composed of van der Waals (vdW) junctions with an atomically thin floating layer for charge storage, is widely employed to develop logic-in memories and in-sensor computing devices. Most research efforts of FGM are spent on achieving long-term charge storage and fast reading/writing for flash and random-access memory. However, dynamic modulation of memory time via a tunneling barrier and vdW interfaces, which is critical for synaptic computing and machine vision, is still lacking. Here, a van der Waals short-term memory with tunable memory windows and retention times from milliseconds to thousands of seconds is reported, which is approximately exponentially proportional to the thickness h-BN (hexagonal boron nitride) barrier. The specific h-BN barrier with fruitful gap states provides charge release channels for trapped charges, making the vdW device switchable between positive photoconductance and negative photoconductance with a broadband light from IR to UV range. The dynamic short-term memory with tunable photo response highlights the design strategy of novel vdW memory vis interface engineering for further intelligent information storage and optoelectronic detection. A new type van der Waals short-term memory is designed to be with a bipolar transfer curve and tunable retention times from milliseconds to thousands of seconds. The specific h-BN barrier provides charge release channels for trapped charges, making the vdW device switchable between positive and negative photoconductance to a broadband range light from IR to UV.image
What problem does this paper attempt to address?