Durability Test of PVP‐capped Pt Nanoclusters Counter Electrode for Highly Efficiency Dye‐sensitized Solar Cell

Jo-Lin Lan,Chi‐Chao Wan,Tzu‐Chien Wei,Wen Dung Hsu,Yu Shan Chang
DOI: https://doi.org/10.1002/pip.1107
2011-01-01
Abstract:ABSTRACT In this paper, the durability of PVP‐capped Pt nanoclusters counter electrode (PVP‐Pt CE) for dye‐sensitized solar cell (DSSC) has been extensively evaluated including electrochemical reaction durability, thermal stress durability and light soaking durability. It is revealed that PVP‐Pt CE exhibits both electrochemical and thermal durability by cyclic voltammetry (CV) and electrochemical impedance spectroscopy (EIS) test. Moreover, DSSC containing PVP‐Pt CE shows over 9.37% conversion efficiency in highly volatile electrolyte system. As to device thermal durability, both low‐volatile and non‐volatile electrolyte systems were tested and the results show relative efficiency can maintain more than 85% after accelerated thermal test at 85°C for 1000 h, and 110% after 60°C for 1000 h. Finally, after continuous light soaking test under 60°C for 1000 h, the relative efficiency can still maintain at 94%. Copyright © 2011 John Wiley & Sons, Ltd.
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