Millimeter-Wave Interferometric for Low-Loss Nonmetallic Sheet Thickness Measurement

Liangping Chen,Yu Qin,Liangjie Bi,Yong Yin,Bin Wang,Hailong Li,Lin Meng
DOI: https://doi.org/10.1109/ivec53421.2022.10292296
2022-01-01
Abstract:A low-cost method for measuring the thickness of low-loss nonmetallic sheet is proposed. This method is based on the sensitivity of millimeter wave coherent synthesis efficiency to phase consistency. A4-size paper sheets with 0.08mm thickness were tested using an experimental system with a working frequency at 35 GHz, and the preliminary experimental results are reported. The thickness of a low-loss nonmetallic sheet less than 0.08 mm can be measured at 35 GHz.
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