Fault Recovery Method for Power Electronic Converters Based on Accelerator-Embedded Digital Twin

Jiaqin Sun,Giampaolo Buticchi,Jing Li,He Zhang,Sandro Guenter,Jiajun Yang
DOI: https://doi.org/10.1109/iecon51785.2023.10312499
2023-01-01
Abstract:This paper presents a digital twin (DT)-based fault recovery method for power electronic converter systems. The method employs a prediction accelerator with a DT model for each subsystem of the converter system and feeds back the predicted system state to the controller. The paper demonstrates that the method can recover from faults such as load and input voltage variations in realtime and can integrate with hardware in the loop for future applications and comparing with other advanced control methods. The paper also highlights the benefits of the method in terms of scalability, replaceability and modularity for power electronic systems.
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