Russian quadruplet quadrupole based Electron beam optics for ultrafast electron microscopy

Yi Yuan,Jian Wang,Danlei Fan,Zhengqiu Luo,Ziyu Fan,Xiaofei Li,Jinfeng Yang,Kuanjun Fan
DOI: https://doi.org/10.1117/12.2668361
2022-01-01
Abstract:Mega-electron-Volt Ultrafast Electron Microscope (MeV UEM) has become a promising tool to real-time observe ultrafast dynamics at the atomic scale, where a magnetic objective lens system is critical to manipulating the high-energy beam to achieve point-to-point imaging. However, the upper limit of spatial resolution is mainly determined by the high-order chromatic aberration resulting from the electron energy spread and the imaging lens system. A magnetic lens system based on the Russian quadruplet(RQ) is being studied to improve the degree of symmetry and further reduce the aberration. The beam optics design and multi-target optimization are finished to achieve a good spatial resolution of point-to-point imaging. This paper will introduce the theoretical deviation and design results of our first-stage imaging lens system, and second-order beam optics is optimized further to improve the resolution.
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