Measurement of the Product Branching Fractionb(c→θcx)×<…

R. Ammar,P. Baringer,P. Brabant,A. Bean,D. Besson,Henry B. Bull,R. Davis,J. Holliday,S. Kotov,Ilya Kravchenko,N. Kwak,I. P. Robertson,R. P. Stutz,X. Zhao,S. Anderson,V. V. Frolov,Y. Kubota,S. J. Lee,R. Mahapatra,J. J. O’Neill,R. Poling,T. Riehle,Alexander Smith,S. Ahmed,M. S. Alam,S. B. Athar,L. Jian,Ling Liu,A. H. Mahmood,M. Saleem,S. Timm,F. R. Wappler,A. Anastassov,J. E. Duboscq,K. K. Gan,C. Gwon,T. Hart,K. Honscheid,H. Kagan,R. Kass,J. Lorenc,H. Schwarthoff,E. von Toerne,M. M. Zoeller,S. J. Richichi,H. Severini,P. Skubic,Alexander Undrus,M. Bishai,S. Chen,J. Fast,J. W. Hinson,J. Lee,N. Menon,David Miller,E. I. Shibata,Ian Peter Joseph Shipsey,Y.-J. Kwon,A. L. Lyon,E. H. Thorndike,C. P. Jessop,K. Lingel,H. Marsiske,М. Перл,V. Savinov,D. Ugolini,Xiang Zhou,T. E. Coan,V. Fadeyev,I. Korolkov,Yurii Maravin,I. Narsky,R. Stroynovvski,J. Ye,T. Włodek,M. Artuso,R. Ayad,E. Dambasuren,S. Köpp,Gobinda Majumder,G. C. Moneti,R. Mountain,S. Schuh,T. Skwarnicki,S. Stone,A. Titov,Georg Viehhauser,J. C. Wang,A. Wolf,J. Wu,S. E. Csorna,K. W. McLean,S. Márka,Xu Zhang,R. Godang,K. Kinoshita,I. C. Lai,P. Pomianowski,S. Schrenk,G. Bonvicini,D. Cinabro,R. Greene,L. P. Perera,G. J. Zhou,S. Chan,G. Eigen,E. Lipeles,M. Śchmidtler,A. Shapiro,W. M. Sun,J. Urheim,A. J. Weinstein,Frank Würthwein,D. E. Jaffe,G. Masek,H. P. Paar,E. M. Potter,S. Prell,Vivek Sharma,D. M. Asner,A. Eppich,J. Gronberg,T. S. Hill,D. J. Lange,R. J. Morrison,T. K. Nelson,J. D. Richman,R. A. Briere,B. H. Behrens,W. T. Ford,A. V. Gritsan,H. Krieg,J. Roy,J. G. Smith,James Alexander,R. Baker,C. Bebek,B. E. Berger,K. Berkelman,F. Blanc,V. Boisvert,D. G. Cassel,M. Dickson,P. S. Drell,K. M. Ecklund,R. Ehrlich,A. D. Foland,P. Gaidarev,L. Gibbons,B. Gittelman,S. W. Gray,D. L. Hartill,B. K. Heltsley,P. I. Hopman,C. D. Jones,D. L. Kreinick,T. Lee,Y. Liu,T. O. Meyer,N. B. Mistry,C. R. Ng,E. Nordberg,J. R. Patterson,D. Peterson,D. Riley,J. G. Thayer,P. G. Thies,B. Valant-Spaight,A. Warburton,Paul Avery,M. Lohner,C. Prescott,A. I. Rubiera,J. Yelton,J. P. Zheng,G. Brandenburg,Alexander Ershov,Y. S. Gao,D. Y.J. Kim,Richard Wilson,T. E. Browder,Y. Li,J. L. Rodriguez,H. Yamamoto,T. Bergfeld,B. I. Eisenstein,J. Ernst,G. E. Gladding,G. D. Gollin,R. M. Hans,E. Johnson,I. Karliner,M. A. Marsh,M. Palmer,C. Plager,C. Sedlack,M. Selen,J. J. Thaler,J. S. Williams,K. W. Edwards,R. Janicek,P. M. Patel,A. J. Sadoff

DOI: https://doi.org/10.1103/physrevd.62.092007

2000-01-01

Abstract:Based on a high statistics e+e−→c¯c data sample, we report on the inclusive rate for charmed baryons to decay into Λ particles using charm-event tagging. We select e+e−→c¯c events which have a clear anti-charm tag and measure the Λ content in the hemisphere opposite the tag (charge conjugate modes are implicit). This allows us to determine the product branching fraction BΛ=B(→cΘcX)×B(Θc→ΛX), where Θc represents a sum over all charmed baryons produced in e+e− fragmentation at √s=10.5 GeV, given our specific tags. We obtain BΛ=(1.87±0.03±0.33)%. Received 28 April 2000DOI:https://doi.org/10.1103/PhysRevD.62.092007©2000 American Physical Society