Abstract:We present a first of its kind framework which overcomes a major challenge in the design of digital systems that are resilient to reliability failures: achieve desired resilience targets at minimal costs (energy, power, execution time, area) by combining resilience techniques across various layers of the system stack (circuit, logic, architecture, software, algorithm). This is also referred to as cross-layer resilience. In this paper, we focus on radiation-induced soft errors in processor cores. We address both single-event upsets (SEUs) and single-event multiple upsets (SEMUs) in terrestrial environments. Our framework automatically and systematically explores the large space of comprehensive resilience techniques and their combinations across various layers of the system stack (586 cross-layer combinations in this paper), derives cost-effective solutions that achieve resilience targets at minimal costs, and provides guidelines for the design of new resilience techniques. We demonstrate the practicality and effectiveness of our framework using two diverse designs: a simple, in-order processor core and a complex, out-of-order processor core. Our results demonstrate that a carefully optimized combination of circuit-level hardening, logic-level parity checking, and micro-architectural recovery provides a highly cost-effective soft error resilience solution for general-purpose processor cores. For example, a 50x improvement in silent data corruption rate is achieved at only 2.1% energy cost for an out-of-order core (6.1% for an in-order core) with no speed impact. However, selective circuit-level hardening alone, guided by a thorough analysis of the effects of soft errors on application benchmarks, provides a cost-effective soft error resilience solution as well (with ~1% additional energy cost for a 50x improvement in silent data corruption rate).

Understanding Silent Data Corruptions in a Large Production CPU Population

Understanding Silent Data Corruption in Processors for Mitigating Its Effects

Silent Data Corruptions at Scale

Tolerating Soft Errors in Processor Cores Using CLEAR (Cross-Layer Exploration for Architecting Resilience)

Characterizing the Effects of Intermittent Faults on a Processor for Dependability Enhancement Strategy

Quantitative Evaluation of Fault Propagation in a Commercial Cloud System.

Investigating Memory Failure Prediction Across CPU Architectures

CLEAR: Cross-Layer Exploration for Architecting Resilience - Combining Hardware and Software Techniques to Tolerate Soft Errors in Processor Cores

Characterizing the L1 Data Cache's Vulnerability to Transient Errors in Chip-Multiprocessors

Countermeasures Against Information Leakage Induced by Data Serialization Effects in a RISC CPU.

On the Characterization of Data Cache Vulnerability in High-Performance Embedded Microprocessors

SiliFuzz: Fuzzing CPUs by proxy

Single Event Effects Assessment of UltraScale+ MPSoC Systems under Atmospheric Radiation

Detecting Recycled Commodity SoCs: Exploiting Aging-Induced SRAM PUF Unreliability

Characterizing Soft Error Vulnerability of Cache Coherence Protocols for Chip-Multiprocessors

Soft Error Effects on Arm Microprocessors: Early Estimations versus Chip Measurements

Modeling the Propagation of Soft Errors in Programs

Side-Channel Information Leakage Analysis And Countermeasures In An Embedded Cpu Microarchitecture

An In-Depth Study Of Correlated Failures In Production Ssd-Based Data Centers

A Quantitative Analysis and Guidelines of Data Streaming Accelerator in Modern Intel Xeon Scalable Processors

A Hardware-Software Collaborated Method for Soft-Error Tolerant MPSoC