Vibration analysis of piezoelectric semiconductor beams with size-dependent damping characteristic

Xueqian Fang,Jiaqin Duan,Changsong Zhu,Jinxi Liu
DOI: https://doi.org/10.1016/j.mtcomm.2023.106929
IF: 3.8
2023-01-01
Materials Today Communications
Abstract:In this paper, the vibration analysis of the piezoelectric semiconductor (PS) beam with size-dependent damping characteristic is conducted based on the nonlocal PS model. The nonlocal constitutive relations including the stress, electric displacement as well as current density of electrons are achieved. The one-dimensional vibration governing equations are obtained by integrating the three-dimensional governing equations along the cross section. Then, the natural frequency and damping characteristic are given by solving the governing equations of the PS beam with simply-supported boundary conditions. Through the numerical results, the effect of the nonlocal parameter, initial electron concentration, length to radius ratio and different scales on the vibration behavior of the system is demonstrated. The main innovation of the manuscript is that the peak value of the damping shifts to the smaller initial electron concentration because of the nonlocal effect, and the damping characteristics of the PS beam at nanoscale, micrometer scale and millimeter scale are obviously different.
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