Few-shot defect detection using feature enhancement and image generation for manufacturing quality inspection
Yu Gong,Mingzhou Liu,Xiaoqiao Wang,Conghu Liu,Jing Hu
DOI: https://doi.org/10.1007/s10489-023-05199-8
IF: 5.3
2023-12-13
Applied Intelligence
Abstract:Visual defect detection, which is pivotal in industrial quality control, often requires extensive datasets for training deep-learning models. However, in industrial environments, the presence of multiple production batches, small lot sizes, and rapidly evolving task requirements make it challenging to acquire sufficient and diverse defect data. To address these challenges, this study introduces an innovative approach to data augmentation and defect detection under few-data conditions. Our strategy employs a two-stage feature-enhancement method complemented by an expert knowledge-based image-generation method. The former ensures robustness in color and richness in feature representation by focusing on local defect irregularities. The latter leverages both the core mechanistic understanding of experts and nonquantitative empirical insights, combined with a variable background domain, to generate rich images with diverse defect features. We evaluated the feasibility and effectiveness of the proposed method using a proprietary dataset curated by an automotive component manufacturing enterprise. The experimental results revealed that, across the five defect categories, training on 2 images achieved an F1-Score of 41.06%, which improved to 67.11% when the training dataset was expanded to 15 images. A comparative analysis with prevailing feature enhancement and image generation methods revealed our solution's superiority, bridging methodological drawbacks, and markedly eclipsing others in terms of enhancement potency. Furthermore, when benchmarked against additional public industrial datasets, the model exhibited exceptional adaptability and superior performance, thus highlighting its potential as a robust tool for quality control in manufacturing scenarios.
computer science, artificial intelligence