Abstract:Limited data usually cause deep neural networks to hold poor performance after training, and many generative models are proposed to synthesize data to improve the performance of models. However, existing models ignore capturing the small defect details (e.g., features and locations), resulting in that most models cannot augment the Defect Location Sensitive Data (DLS data) in which the ratio of object size to the image size is small (e.g., 20%) and the locations of the defects are only on the object. In this paper, we propose a new augmentation model, named Defect Location Sensitive data augmentation GAN (DLS-GAN), to address DLS data augmentation problem. First, we modify the vanilla generator with two Encoder-Decoder models, and view the limited masked-images masked by labeling the defect-free pixels while remaining the defect pixels in defect images and many defect-free images as the input of the two models. The extracted feature map from the first Encoder-Decoder model provides the defect features and location information; the second one extracts the features of defect-free images, and integrates the two different features with a designed Defect Feature Transfer Module to synthesize images with desired defects. Second, we employ two discriminators to estimate the scores of both distribution matching degree and defect similarity between real data and generated ones. With the two modifications, we design a new loss function, and then prove that it makes our model get converged. Last, we conduct extensive experiments to demonstrate the significant performance improvement and generalizability of DLS-GAN on different types of DLS datasets. The experimental results show that our DLS-GAN outperforms the SOTA generative models in terms of synthesizing high quality images with desired defects. Note to Practitioners—Automated defect image detectors play an important role in the field of automated manufacturing. Training a detector with superior detection performance usually requires a large number of samples. However, it is difficult to collect many defect samples in practice. Although existing generative methods can synthesize realistic-like images, they cannot generate the Defect Location Sensitive Data (DLS Data) which refer to the samples that the defects appear at the specific locations in product objects, resulting in the synthesized images invalid. This paper proposes a new defect image generation model called DLS-GAN to address this problem, and validates its performance in different real-world industrial datasets ranging from DLS Data to Non-DLS Data. Such generated images can be adopted as useful resources for improving the detection performance of automated detector.

Defect Sample Image Generation Method Based on GANs in Diamond Tool Defect Detection

Online Adversarial Knowledge Distillation for Image Synthesis of Bridge Defect

Dual-Path GAN: A Method for Enhancing Small-scale Defect Detection on Metal Images

Defect-GAN: High-Fidelity Defect Synthesis for Automated Defect Inspection

Surface defect sample generation method based on GAN

DG-GAN: A High Quality Defect Image Generation Method for Defect Detection

Mask2Defect: A Prior Knowledge Based Data Augmentation Method for Metal Surface Defect Inspection

Particleboard Surface Defect Inspection Based on Data Augmentation and Attention Mechanisms

P‐4.10: Simulation Algorithm of Industrial Defects based on Generative Adversarial Network

Defect Transfer GAN: Diverse Defect Synthesis for Data Augmentation

DG2GAN: improving defect recognition performance with generated defect image sample

DLS-GAN: Generative Adversarial Nets for Defect Location Sensitive Data Augmentation

A High-Quality Sample Generation Method for Improving Steel Surface Defect Inspection

Few-Shot Defect Image Generation via Defect-Aware Feature Manipulation

Utilizing Generative Adversarial Networks for Image Data Augmentation and Classification of Semiconductor Wafer Dicing Induced Defects

Sketch-guided spatial adaptive normalization and high-level feature constraints based GAN image synthesis for steel strip defect detection data augmentation

Cross-Domain Defect GAN: Defect Generation for Defect Detection in Industrial Area

Tool Condition Monitoring Method Based on Generative Adversarial Network for Data Augmentation

An effective defect detection method based on improved Generative Adversarial Networks (iGAN) for machined surfaces

A Survey of Defect Detection Applications Based on Generative Adversarial Networks

A Surface Defect Detection Method Based On Positive Samples