Single-shot super-resolution total internal reflection fluorescence microscopy

Min Guo,Panagiotis Chandris,John Paul Giannini,Adam J. Trexler,Robert Fischer,Jiji Chen,Harshad D. Vishwasrao,Ivan Rey-Suarez,Yicong Wu,Clare M. Waterman,George H. Patterson,Arpita Upadhyaya,Justin Taraska,Hari Shroff
DOI: https://doi.org/10.1101/182121
2017-01-01
Abstract:AbstractWe demonstrate a simple method for combining instant structured illumination microscopy (SIM) with total internal reflection fluorescence microscopy (TIRF), doubling the spatial resolution of TIRF (down to 115 +/-13 nm) and enabling imaging frame rates up to 100 Hz over hundreds of time points. We apply instant TIRF-SIM to multiple live samples, achieving rapid, high contrast super-resolution imaging in close proximity to the coverslip surface.
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