Ultrathin Limit of Exchange Bias Coupling at Oxide Multiferroic/Ferromagnetic Interfaces

M. Huijben,P. Yu,L. W. Martin,H. J. A. Molegraaf,Y.‐H. Chu,M. B. Holcomb,N. Balke,G. Rijnders,R. Ramesh
DOI: https://doi.org/10.1002/adma.201300940
IF: 29.4
2013-01-01
Advanced Materials
Abstract:Exchange bias coupling at the multiferroic- ferromagnetic interface in BiFeO3/La0.7Sr0.3MnO3 heterostructures exhibits a critical thickness for ultrathin BiFeO3 layers of 5 unit cells (2 nm). Linear dichroism measurements demonstrate the dependence on the BiFeO3 layer thickness with a strong reduction for ultrathin layers, indicating diminished antiferromagnetic ordering that prevents interfacial exchange bias coupling.
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