The Millimeter-Wave Radar SLAM Assisted by the RCS Feature of the Target and IMU
Yang Li,Yutong Liu,Yanping Wang,Yun Lin,Wenjie Shen
DOI: https://doi.org/10.3390/s20185421
IF: 3.9
2020-09-22
Sensors
Abstract:Compared with the commonly used lidar and visual sensors, the millimeter-wave radar has all-day and all-weather performance advantages and more stable performance in the face of different scenarios. However, using the millimeter-wave radar as the Simultaneous Localization and Mapping (SLAM) sensor is also associated with other problems, such as small data volume, more outliers, and low precision, which reduce the accuracy of SLAM localization and mapping. This paper proposes a millimeter-wave radar SLAM assisted by the Radar Cross Section (RCS) feature of the target and Inertial Measurement Unit (IMU). Using IMU to combine continuous radar scanning point clouds into “Multi-scan,” the problem of small data volume is solved. The Density-based Spatial Clustering of Applications with Noise (DBSCAN) clustering algorithm is used to filter outliers from radar data. In the clustering, the RCS feature of the target is considered, and the Mahalanobis distance is used to measure the similarity of the radar data. At the same time, in order to alleviate the problem of the lower accuracy of SLAM positioning due to the low precision of millimeter-wave radar data, an improved Correlative Scan Matching (CSM) method is proposed in this paper, which matches the radar point cloud with the local submap of the global grid map. It is a “Scan to Map” point cloud matching method, which achieves the tight coupling of localization and mapping. In this paper, three groups of actual data are collected to verify the proposed method in part and in general. Based on the comparison of the experimental results, it is proved that the proposed millimeter-wave radar SLAM assisted by the RCS feature of the target and IMU has better accuracy and robustness in the face of different scenarios.
engineering, electrical & electronic,chemistry, analytical,instruments & instrumentation