Abstract:The crystallinity improvement of a perovskite film is one of the most important factors that determines its final photovoltaic performance. In this work, we unusually initiated the perovskite film fabrication by taking advantage of elemental Cu–Pb composite films as novel precursors. After a simple one-step spin-coating process and a reaction at room temperature, the corresponding X-ray diffraction (XRD) results of the resulting Cu-containing perovskite films clearly exhibited an extremely high crystallization nature with a (110) orientation. Particularly, the (110) diffraction peak intensity of the optimized Cu-doped sample is about 100× higher than that of the control perovskite thin films, which should be the best crystallinity improvement among the reported perovskite material preparations. X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), energy dispersive spectroscopy (EDS), transmission electron microscopy (TEM), and selected area electron diffraction (SAED) analyses revealed that copper ions were indeed incorporated in the perovskite lattice by occupying the position of methylamine ions, which formed a heavily doped (CH3NH3)1–xCuxPbI3 perovskite structure with an excellent structural stability. The effects of various parameters, including the reaction type, the precursor concentration, the rotation speed, the reaction temperature and time, the initial thickness of the Cu–Pb composite films, the surrounding humidity, and the initial copper content, on the diffraction intensity of the Cu-doped perovskites were carefully investigated. The transient-surface photovoltage (TSPV) measurement indicated that the conduction type of the resulting perovskite films changed from p-type to the unconventional n-type, which was probably induced by the heavy Cu doping. The transportation performances were thus significantly improved, while the recombination was reduced due to the high crystallinity. The novel copper–lead composite-initiated approach may pave the way for the future design and fabrication of metal-doped perovskite thin films with ultrahigh crystallizations and good stabilities.The Supporting Information is available free of charge at <a class="ext-link" href="/doi/10.1021/acs.cgd.0c01280?goto=supporting-info">https://pubs.acs.org/doi/10.1021/acs.cgd.0c01280</a>.Cross-sectional SEM, XPS results, SEM patterns, UV–vis absorbance spectra, TSPV test results, and the stability result (<a class="ext-link" href="/doi/suppl/10.1021/acs.cgd.0c01280/suppl_file/cg0c01280_si_001.pdf">PDF</a>)This article has not yet been cited by other publications.

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