Abstract:With the rapid development of approximate computing technology, the reliability evaluation of approximate circuits has attracted significant interest. So far, few methods can be applied to estimate the reliability of approximate circuits, the existing methods are based on probability transfer module (PTM) and Monte Carlo (MC) method. However, the PTM-based methods are confined to small-scale approximate circuits and large circuits with weak signal correlation, and the MC method is time-consuming to obtain accurate results. This paper proposes an algorithm for determining the acceptable outputs of approximate dividers based on the design principle of the approximate divider. Then based on the probability gate model (PGM), this paper presents three methods for reliability estimation of gate-level approximate arithmetic circuits. The non-processing correlation algorithm does not consider the correlation among signals to obtain an approximate value of circuit reliability, and its time complexity keeps a linear relation with the number of gates. The processing correlation algorithm can estimate the correlation caused by fanout nodes of the approximate arithmetic circuits, and it has the obvious advantage on accuracy. However, its time complexity is exponential with the number of fanout nodes in the circuit. The fusion algorithm considers the effect of each fanout node on the reliability of the circuit separately and then uses a linear model to obtain the circuit reliability. Although some accuracy is lost, the time complexity is linear. The experimental results on benchmark circuits show that the proposed methods are effective, and have certain advantages in accuracy and efficiency as compared with the existing methods.

Locating Critical-Reliability Gates for Sequential Circuits based on the Time Window Graph Model

Uniform Non-Bernoulli Sequences Oriented Locating Method for Reliability-Critical Gates

A statistical approach for full-chip gate-oxide reliability analysis

A Locating Method for Reliability-Critical Gates with a Parallel-Structured Genetic Algorithm

Implementation and Analysis of Probabilistic Methods for Gate-Level Circuit Reliability Estimation

Design of probabilistic-based Markov Random Field logic gates in 65nm CMOS technology

Identifying Reliability High-Correlated Gates of Logic Circuits with Pearson Correlation Coefficient

An Efficient Reliability Estimation Method for Gate-level Circuit

Identifying Reliability-Critical Primary Inputs of Combinational Circuits Based on the Model of Gate-Sensitive Attributes.

An Approximate Soft Error Reliability Sorting Approach Based on State Analysis of Sequential Circuits

Wafer Level Reliability Evaluation of Gate Oxide for Advanced CMOS Process

Probability Gate Model Based Methods for Approximate Arithmetic Circuits Reliability Estimation

A Method of Gate-Level Circuit Reliability Estimation Based on Iterative PTM Model

Defect Analysis Oriented Calculation of Fault Probability for Generalized Gates

A Stochastic Computational Approach for Accurate and Efficient Reliability Evaluation

A Reliability-Critical Path Identifying Method with Local and Global Adjacency Probability Matrix in Combinational Circuits

Reliability Estimation of Sequential Circuit Based on Probabilistic Transfer Matrices

Efficient reliability evaluation of combinational and sequential logic circuits

Accurate Reliability Analysis of Concurrent Checking Circuits Employing an Efficient Analytical Method

Statistical Timing Analysis and Criticality Computation for Circuits with Post-Silicon Clock Tuning Elements

Accelerating stochastic‐based reliability estimation for combinational circuits at RTL using GPU parallel computing