Patch Variational Autoencoder-based Industrial Defect Detection

Yanqing Yang,Jianxu Mao,Yaonan Wang,Hui Zhang,Xianen Zhou,Yurong Chen
DOI: https://doi.org/10.23919/ascc56756.2022.9828054
2022-01-01
Abstract:Anomaly detection occupies an important position in the field of industrial automation and manufacturing intelligence. This paper aims to alleviate two of the inherent problems in variational inference-based anomaly analysis. One of the problems is the information obtained from prior latent distribution is limited, and the other one is the feature collapse phenomenon caused by the strong probability distance notion. In this paper, a patch variational autoencoder architecture with jigsaw puzzle solving is proposed, which is able to increase the expressiveness of the latent manifold. And we introduce a sliced-Wasserstein measure to solve the second problem. There is a superior performance on the MVTec AD datasets.
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