A Class of Auxiliary Passivators for Polymer Dielectrics

Xiao-Fen Li,Tian-Yu Wang,Shunning Li,Gui-Xin Zhang,Jian-Bo Liu
DOI: https://doi.org/10.1002/aelm.202200887
IF: 6.2
2023-01-01
Advanced Electronic Materials
Abstract:High-electrical-strength polymer dielectrics are essential for advanced devices with high power and/or high integration densities and film capacitors with high energy-storage densities. Key factors affecting the polymer dielectric electrical strength are deep-level defect states, which lead to electron and hole accumulation. Numerous deep-level defect states lead to charge accumulation in the polymer dielectric during operation, contributing to local electric field distortion and resulting in flashover or breakdown. In this work, first-principles calculations and experiments reveal that V-H (i.e., H vacancies) in the polymer dielectric molecular chain can create defect states deep in the bandgap. RCl (R = Li, Na, K) can be used for passivating the deep-level polymer dielectric defect states. In addition, the passivation mechanisms are analyzed. The RCl cations can passivate deep-level defect states into shallow-level acceptor defect states because the RCl dipole moment regulates the deep-level defect state energy. The RCl anions can passivate deep-level defect states into shallow-level donor defect states by forming a stable covalent bond between carbon and lone-pair electrons. This work supports the design of high-electrical-strength polymer dielectrics.
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