A workflow for single‐particle structure determination via iterative phasing of rotational invariants in fluctuation X‐ray scattering

Tim B. Berberich,Serguei L. Molodtsov,Ruslan P. Kurta
DOI: https://doi.org/10.1107/s1600576724000992
IF: 4.868
2024-03-17
Journal of Applied Crystallography
Abstract:A single‐particle structure determination pipeline is implemented in the open‐source software xFrame, which includes methods for determining rotational invariants from X‐ray scattering patterns and performing structure reconstructions by iterative phasing of rotational invariants.Fluctuation X‐ray scattering (FXS) offers a complementary approach for nano‐ and bioparticle imaging with an X‐ray free‐electron laser (XFEL), by extracting structural information from correlations in scattered XFEL pulses. Here a workflow is presented for single‐particle structure determination using FXS. The workflow includes procedures for extracting the rotational invariants from FXS patterns, performing structure reconstructions via iterative phasing of the invariants, and aligning and averaging multiple reconstructions. The reconstruction pipeline is implemented in the open‐source software xFrame and its functionality is demonstrated on several simulated structures.
chemistry, multidisciplinary,crystallography
What problem does this paper attempt to address?