Abstract:Double perovskite La2FeCrO6 (LFCO) oxide powders were synthesized by a mild hydrothermal process. Their structural, magnetic, and dielectric properties are reported. The LFCO powders adopt an orthorhombic distorted perovskite structure with Pnma space group. Scanning electron microscopy images depicted that the LFCO powders were homogeneous distribution with spherical morphology and the average particle size was 900 nm. Energy dispersive spectra (EDS) gave out the molar ratio of the cationic elements (La:Fe:Cr) close to the nominal stoichiometry. X-ray photoelectron spectroscopy (XPS) spectra reveal the mixed oxidation states of Fe2+ and Fe3+ ions and Cr3+ and Cr4+ ions in the LFCO powders as well as two types of oxygen species (namely lattice oxygen and oxygen vacancies), and La is presented as La3+. A ferrimagnetic behavior was observed at 5 K in the LFCO powders with saturation magnetization, MS = 0.182 μB/f.u. and coercive field, HC = 8.0 kOe as well as the Neel temperature, TN = 112 K. Such a ferrimagnetic behavior is dominated by the Fe3+–Cr3+ double-exchange interaction via the oxygen mediator. The temperature dependent magnetization shows a large irreversibility between the ZFC-FC curves. That is ascribed to the predominant alignments of the spin orientations increasing fast under the applied external magnetic field. Dielectric measurements demonstrated a strong frequency dependent dielectric behavior of the LFCO ceramics. The higher dielectric constants and dielectric losses observed at low frequencies can be understood based on the Maxwell-Wagner relaxation model. The temperature dependent dielectric properties revealed a ferroelectric-to-paraelectric structural phase transition undergone at ~ 260 K at low frequencies, while at high frequencies a much broad and diffuse phase transition appeared mainly owing to the almost fully random distributions of Fe and Cr cations at B-site in the LFCO ceramics with high content of anti-site defects (ASDs = 45.75%). The activation energy for this dielectric relaxation process was estimated to be 0.586 eV, close to that reported for the singly ionized oxygen vacancy in perovskite oxides, indicating that the movement of singly ionized oxygen vacancy is responsible for this dielectric relaxation behavior.

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