Research on Defects Recognition Method Based on Impedance Information

Xu Zhang,Jian Zhang,Libing Bai,Lulu Tian,Jie Zhang,Yuhua Cheng
DOI: https://doi.org/10.1109/ICSMD50554.2020.9261735
2020-01-01
Abstract:Eddy current pulsed thermography (ECPT) can acquire the transient thermal image of conductive materials. The defects profile obtained by thermal image is not clear due to the thermal diffusion effect. There is a lot of information in the thermal image that's not being utilized. The distribution of eddy current can be obtained from the thermal image. This paper proposes a method to extract the distribution of impedance from the distribution of eddy current through electric field constraints. The distribution of impedance can recognize the defects profile more clearly. Experimental results show that the defects profile recognition using the distribution of impedance is more accurate than the others.
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