Electron thermal internal transport barriers triggered by the effect of ion shielding

Lei Ye,Zhengping Luo,Xiaotao Xiao,Chengkang Pan,Yuehang Wang,Yao Huang,Qing Zang,Fei Chen,Yifei Jin,Shouxin Wang,Bojiang Ding,Bingjia Xiao,Shaojie Wang
DOI: https://doi.org/10.1088/1741-4326/ac9c18
IF: 3.3
2022-10-22
Nuclear Fusion
Abstract:The formation of electron thermal internal transport barriers (eITBs) are investigated by critical gradient threshold analysis for recent EAST experiments with dominant RF heating and low torque injection. The ratio of electron temperature to ion temperature, \tau=T_{e}/T_{i}, is identified to be the key parameter that triggers eITB in the hot electron mode through the electron turbulence suppression by the effect of ion shielding. The critical gradient of ETG turbulence can be greatly increased with \tau due to strong electron heating and weak electron-ion energy coupling. The formation and evolution of eITB is found to be determined by the critical temperature gradient of electron turbulence.
physics, fluids & plasmas
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