Enhancing Hot Electron Injection in Plasmonic Photodetectors through Roughened Interfaces

Long Xiao,Shancheng Yan,Tianhong Chen,Junzhuan Wang,Yi Shi

DOI: https://doi.org/10.3390/sym14081628

2022-01-01

Abstract:Ongoing efforts have been made to improve the photoresponsivity of plasmonic photodetectors. In this work, the photodetectors based on transparent conductive oxide (TCO)/Semiconductor/Metal configuration especially with a roughened interface were investigated numerically, and the effect of the roughness on the injection efficiency of hot electrons was analyzed. The simulated results indicate that a roughened structure alleviates effectively the momentum mismatch of hot electrons at the metal/semiconductor interface due to asymmetry factor, and greatly improves the injection efficiency as well as photoresponsivity. At the incidence wavelength of 1550 nm, the photoresponsivity increased by about 8 times. Meanwhile, the influence on the resonant wavelength shift is negligible where the roughness is nano-scale. Our work provides a valuable guidance for the theoretical and experimental research of plasmonic photodetectors.