Abstract:Leveraging quantum effects in metrology such as entanglement and coherence allows one to measure parameters with enhanced sensitivity. However, time-dependent noise can disrupt such Heisenberg-limited amplification. We propose a quantum-metrology method based on the quantum-signal-processing framework to overcome these realistic noise-induced limitations in practical quantum metrology. Our algorithm separates the gate parameter $\varphi$~(single-qubit Z phase) that is susceptible to time-dependent error from the target gate parameter $\theta$~(swap-angle between |10> and |01> states) that is largely free of time-dependent error. Our method achieves an accuracy of $10^{-4}$ radians in standard deviation for learning $\theta$ in superconducting-qubit experiments, outperforming existing alternative schemes by two orders of magnitude. We also demonstrate the increased robustness in learning time-dependent gate parameters through fast Fourier transformation and sequential phase difference. We show both theoretically and numerically that there is an interesting transition of the optimal metrology variance scaling as a function of circuit depth $d$ from the pre-asymptotic regime $d \ll 1/\theta$ to Heisenberg limit $d \to \infty$. Remarkably, in the pre-asymptotic regime our method's estimation variance on time-sensitive parameter $\varphi$ scales faster than the asymptotic Heisenberg limit as a function of depth, $\text{Var}(\hat{\varphi})\approx 1/d^4$. Our work is the first quantum-signal-processing algorithm that demonstrates practical application in laboratory quantum computers.

Experimental beating the standard quantum limit under non-markovian dephasing environment

Testing the Unified Bounds of the Quantum Speed Limit

Unconditional and Robust Quantum Metrological Advantage beyond N00N States

Beyond Heisenberg Limit Quantum Metrology through Quantum Signal Processing

Beating Standard Quantum Limit with Weak Measurement

Prefect Protection of Quantum-Enhanced Metrology from Dephasing Noise

Quantum Simulation of Bound-State-Enhanced Quantum Metrology

Reviving the Precision of Multiple Entangled Probes in an Open System by Simple Π-Pulse Sequences

GHZ protocols enhance frequency metrology despite spontaneous decay

Control-enhanced non-Markovian quantum metrology

Loss-tolerant state engineering for quantum-enhanced metrology via the reverse Hong-Ou-Mandel effect

Loss-tolerant quantum enhanced metrology and state engineering via the reverse Hong-Ou-Mandel effect

Quantum-Enhanced Metrology with Network States

Quantum-enhanced metrology with large Fock states

Entanglement-enhanced quantum metrology: from standard quantum limit to Heisenberg limit

Heisenberg-limited quantum metrology using 100-photon Fock states

Entanglement-Enhanced Sensing in a Lossy and Noisy Environment

Quantum Metrology in Correlated Environments

Heisenberg-limited metrology with perturbing interactions

Restoring metrological quantum advantage of measurement precision in noisy scenario