Image-to-Class Metric based on Category Traversal for Few-shot Learning

Sihao Yuan,Qishen Li,Hua Huang,Qiufeng Li
DOI: https://doi.org/10.1109/itaic54216.2022.9836774
2022-01-01
Abstract:The purpose of few-shot learning is to learn a classification model with good generalization performance. When there is only one sample or several samples, the model can also be quickly generalized to new categories. In this paper, we use the method based on metric learning to complete the few-shot learning image classification task. In this method, we introduce a feature learning module to improve the representation ability of the feature extraction network. Through category traversal, the module extracts the intra-class common features and inter-class unique features of images. Finally, by comparing the similarity between the input image and the local descriptors of each category, the classification task is completed by the image-to-class measure. This metric is achieved by <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$k$</tex> -NN search in the local descriptors, in this way, we can make full use of all the local features of a category, thus expressing the distribution of this class more richly and effectively.
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