Application of Ensemble Empirical Mode Decomposition in Low-Frequency Lightning Electric Field Signal Analysis and Lightning Location
Xiangpeng Fan,Yijun Zhang,Paul R. Krehbiel,Yang Zhang,Dong Zheng,Wen Yao,Liangtao Xu,Hengyi Liu,Weitao Lyu
DOI: https://doi.org/10.1109/tgrs.2020.2991724
IF: 8.2
2021-01-01
IEEE Transactions on Geoscience and Remote Sensing
Abstract:The application of empirical mode decomposition (EMD) in the analysis and processing of lightning electric field waveforms acquired by the low-frequency e-field detection array (LFEDA) in China has significantly improved the capabilities of the low-frequency/very-low-frequency (LF/VLF) time-of-arrival technique for studying the lightning discharge processes. However, the inherent mode mixing and the endpoint effect of EMD lead to certain problems, such as an inadequate noise reduction capability, the incorrect matching of multistation waveforms, and the inaccurate extraction of pulse information, which limit the further development of the LFEDA's positioning ability. To solve these problems, the advanced ensemble EMD (EEMD) technique is introduced into the analysis of LF/VLF lightning measurements, and a double-sided bidirectional mirror (DBM) extension method is proposed to overcome the endpoint effect of EMD. EEMD can effectively suppress mode mixing, and the DBM extension method proposed in this article can effectively suppress the endpoint effect, thus greatly improving the accuracy of a simulated signal after a 25–500-kHz bandpass filter. The resulting DBM_EEMD algorithm can be used in the LFEDA system to process and analyze the detected electric field signals to improve the system's lightning location capabilities, especially in terms of accurate extraction and location of weak signals from lightning discharges. In this article, a 3-D image of artificially triggered lightning obtained from an LF/VLF location system is reported for the first time, and methods for further improving the location capabilities of the LF/VLF lightning detection systems are discussed.
imaging science & photographic technology,remote sensing,engineering, electrical & electronic,geochemistry & geophysics