Simulation-driven Learning: a Deep Learning Approach for Image Scanning Microscopy Via Physical Imaging Models

Baoyuan Zhang,Xuefeng Sun,Hongxia Yang,Cheng Guo,Biwei Wu,Jiubin Tan,Weibo Wang
DOI: https://doi.org/10.1364/oe.450429
IF: 3.8
2022-01-01
Optics Express
Abstract:Image reconstruction based on deep learning has become an effective tool in fluorescence microscopy. Most deep learning reconstruction methods ignore the mechanism of the imaging process where a large number of datasets are required. In addition, a lot of time is spent solving the aliasing problem from multi-scaled image pairs for data pre-processing. Here we demonstrate an improved generative adversarial network for image scanning microscopy (ISM) that can be trained by simulation data and has good generalization. Based on physical imaging models, this method can generate matching image pairs from simulation images and uses them as datasets for network training, without capturing a large number of real ISM images and avoiding image alignment preprocessing. Simulation and experimental results show that this simulation data-driven method improves the imaging quality of conventional microscopic images and reduces the cost of experiments. This method provides inspiration for optimizing network generalizability of the deep learning network.
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