An Open Circuit Faults Diagnosis Method Based on XG-Boost Used in MMC

Xue Hu,Hefei Jia,Yan Deng
DOI: https://doi.org/10.1109/powercon53785.2021.9697684
2021-01-01
Abstract:Submodule (SM) fault diagnosis is necessary for the reliability of modular multilevel converters (MMC) and the complex operating environment of MMC may cause missing data and noise in signal detections, where some of the existing open circuit fault diagnosis methods can be disabled. An artificial intelligence (AI) diagnosis method for open circuit faults in MMC based on extreme gradient boosting system (XG-Boost) is proposed in this paper which can diagnose the open circuit fault quickly and accurately in the mentioned conditions. Compared with neural network diagnosis method, the proposed method has higher accuracy with the same non-ideal data. Faster speed and better processing ability of the proposed method are also validated by simulation of a three-phase MMC in MATLAB/Simulink.
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